Free Ebook A Designer's Guide to Built-In Self-Test (Frontiers in Electronic Testing), by Charles E. Stroud
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A Designer's Guide to Built-In Self-Test (Frontiers in Electronic Testing), by Charles E. Stroud
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A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
- Sales Rank: #2651102 in Books
- Brand: Brand: Springer
- Published on: 2002-05-31
- Original language: English
- Number of items: 1
- Dimensions: 9.21" h x .81" w x 6.14" l, 1.52 pounds
- Binding: Hardcover
- 320 pages
- Used Book in Good Condition
Most helpful customer reviews
0 of 0 people found the following review helpful.
good coverage of BIST methods
By W Boudville
Built-in Self-Test is now highly desirable in chip design. As the linewidth keeps decreasing, and the number of transistors rises, the sheer complexity necessitates BIST as a basic design principle. Hence Stroud offers you a recent and timely survey of BIST methods. The writing quality is not bad, and he gives a good coverage of the most common methods used in the industry.
Whether some of these prove practical in your situation is another matter, of course. If you have existing standard cells that you must use, or conform to, and a fab with specific design rules, then some BIST methods might be precluded.
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